As Semiconductor designs continue to scale in complexity and integration, ensuring that chips can be tested thoroughly and economically has become a strategic priority. Manufacturing defects, process variations, and subtle design issues can render even functionally correct designs unusable if they are not detected efficiently during production. Design for Testability https://cashdjotw.iyublog.com/38324424/building-long-term-competence-in-vlsi-through-structured-and-focused-learning